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Omniscan X3 phased array flaw detector

Omniscan X3 phased array flaw detector

Omniscan X3 flaw detector has a very familiar feeling: it still retains the characteristics of high portability and a strong shell suitable for industrial environment, but its user interface is more concise and more modern.

Airborne TOFD function

2 ut channels

It passed the fall test and met the IP65 rating standard

8 sets of sound beam settings

Compatible with existing Olympus scanners and probes

16: 128pr configuration or 32:128pr configuration

According to ISO 18563-1:2015 and en12668-1:2010

Precision and high efficiency technology

Full focus method (TFM) images can be acquired by full matrix capture (FMC) (supporting 64 wafer apertures)

4 GB of large file capacity, 64 GB of memory

Well designed software, greatly reducing the number of keys

Create the entire scan plan in a single workflow

Through the "single scan" mode, quickly collect the calibration envelope

1024 focus rules


Faster setup

Multiple probes / groups can be configured at one time

The setup of double crystal linear, matrix and double moment array is created on the instrument

Automatic wedge verification

Single scan calibration

Simultaneous multipoint time correction gain (TCG) is used for data acquisition

Simplified calibration verification process for saved settings


The clearer phased array image is helpful for the user to interpret the signal indication more confidently. By using the full focus mode (TFM) function, the user can obtain clearer images of each part of the whole volume of the workpiece, and fuse these images together to generate images that correctly reflect the geometry of the workpiece, so that the user can verify the defect characteristics obtained by using the conventional phased array technology. Up to 64 active wafers can be used for full matrix capture operation to greatly increase the coverage area of full focus mode (TFM) and optimize the detection resolution.

Some other functions, including 16 bit A-scan, interpolation and smoothing, can improve the quality of phased array imaging, so that the defect scanning can be completed more effectively.

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